D
Damage, 270–285, 450
damage-resistant materials, 33
feedback loop, 590
mechanisms, 293
Dark-field imaging, 635
Dark-line damage
energy flux for, 589–590
Dark-line defect (DLD), 573–575, 575f
Dark-spot defect (DSD), 573–575, 575f
Decapsulation, 623–626
Deep level transient spectroscopy (DLTS), 115
Deep-trench capacitor, 436
Defect density-area product, 167
Defect-density functions, 168
Defect-related failures, 343–344, 597
Defects, 111
See also Yield
crystalline solids and semiconductors
dislocations, 121–126
general considerations, 112–114
grain boundaries, 126–129
point defects, 114–121
processing, 129–145
Degradation, 25–26, 30, 81, 240, 287
Delamination wear, 518
Dendrite growth, 417–418
Denuded zone, 121
Depackaging, 599
Depletion ...

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