Reliability and Failure of Electronic Materials and Devices, 2nd Edition

C

C-AM, 620

C-SCAN mode, 620

C-V curves, 151

Cable-jacket defects, 593–594

CAIRO, See Computer-aided integrated reliability optimization

Capacitance–voltage characteristics (C–V characteristics), 67–68

Capacitive coupling voltage contrast (CCVC), 650

Capacitor failures, 206

Capillarity theory, 281–282

Capillary

action, 583

adhesion, 153–154

force, 156–158

Card edge connector, 512–513

Carrier mobility, 124, 687–688

Catastrophic optical damage (COD), 575–576

Catastrophic-degradation mode, 571–573

Cathodoluminescence (CL), 632–634

Cavitation

bubbles, 158–159

effects, 299–300

CCD, See Charge coupled devices

CCVC, See Capacitive coupling voltage contrast

Cd-plated screw fasteners, 141

CDF, See Cumulative distribution function

CDM, See Charged device model

Central limit theorem, ...