Index 
Aboulhamid, M.E., 42
Abraham, J.A., 43
Absorbing state, 185 209, 219, 244
Adaptive cuts, 202
Adaptive set of weights, 224
Advanced Micro Devices Inc., 312
Affected subset, 180 Agarwal, V.K., 41, 108, 143
Ando, H., 33
Andresen, E., 153
Aperiodic circuit, 183
Arzoumanian, Y., 289
Asynchronous logic, avoidance of, 15
Autocorrelation function, 79–80
Automatic test equipment, 9
software for, 322
Automatic test pattern generation, 3
for embedded memory, 33
Auxiliary gate, 205
Backtrace, 325
Bardell, P.H., 12, 160, 208, 280, 283, 285, 288
Beauchamp, K.G., 104
Bed of nails, 23
Bennetts, R.G., 11
Berg, W.C.. 52
Bernoulli trial, 180
Bhattacharya, B.B., 117
Bidirectional double latch, 306–308
Bidirectional driver-receivers, 317
Bidirectional linear feedback shift register (LFSR), 307
Bidirectional multiple input shift register (MISR), 308
Binary network, linear, 64
Birkhoff, G., 163
diagnosis, 322
Bozorgui-Nesbat, S., 40
Brehme, D., 43
Breuer, M.A., 60
Brglez, F., 241
Bridging faults, 4
Brillhart, J., 76
Beuhler, M.G., 43
Buffer register, 291
Built-in evaluation and ...
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