Chapter 12. Test Technology Trends in the Nanometer Age
Kwang-Ting (Tim) ChengUniversity of California, Santa Barbara, California
Wen-Ben JoneUniversity of Cincinnati, Cincinnati, Ohio
Laung-Terng (L.-T.) WangSynTest Technologies, Inc., Sunnyvale, California
About this Chapter
Over the past three decades, we have seen semiconductor manufacturing technology advance from 4 microns to 65 nanometers. The shrinkage of feature size has made a dramatic impact on design and test. Now, we can see system-on-chip (SOC) designs embed 100 million transistors running in the gigahertz range. Within the next decade, there will be designs containing a billion transistors. These designs can include all varieties of digital, analog, mixed-signal, memory, optical,
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