Chapter 11. Analog and Mixed-Signal Testing
Chauchin SuNational Chiao Tung University, Hsinchu, Taiwan
About this Chapter
Analog and mixed-signal (AMS) circuits are becoming more critical in the system-on-chip (SOC) era, although they are occupying less silicon area. AMS circuits are designed using specialized techniques because a wide range of circuit structures are possible. Dedicated customization is required for various process technologies to satisfy performance requirements. Similarly, AMS testing depends strongly on the circuit and so depends on specialized approaches. This chapter introduces AMS circuits, failure modes, and fault models. It then addresses analog testing, including DC and AC parametric testing. Waveform-oriented testing and ...
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