Chapter 8. Memory Testing and Built-In Self-Test
Cheng-Wen WuNational Tsing Hua University, Hsinchu, Taiwan
About this Chapter
Semiconductor memory testing research dates back to the early 1960s, with a history aligned with the growth of IC industry. Although test time and test coverage have always been major concerns, the industry basically enjoys mature techniques and tools for manufacturing test of memory products. The introduction of system chips did bring forth new problems for researchers. Both the number of embedded memory cores and area occupied by memories are rapidly increasing on system chips. The yield of on-chip memories thus determines chip yield. Go/no-go testing is no longer enough for embedded memories in the system-on-chip (SOC) ...
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