Chapter 4. Test Generation
Michael S. Hsiao
Virginia Tech, Blacksburg, Virginia
About this Chapter
Test generation is the task of producing an effective set of vectors that will achieve high fault coverage for a specified fault model. While much progress has been made over the years in automatic test pattern generation (ATPG), this problem remains an extremely difficult one. Without powerful ATPGs, chips will increasingly depend on design for testability (DFT) techniques to alleviate the high cost of generating vectors. This chapter deals with the fundamental issues behind the design of an ATPG, as well as the underlying learning mechanisms that can improve the overall performance of ATPG.
This chapter is organized as follows. First, an overview of ...
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