Chapter 2. Design for Testability
Laung-Terng (L.-T.) WangSynTest Technologies, Inc., Sunnyvale, California
Xiaoqing WenKyushu Institute of Technology, Fukuoka, Japan
Khader S. Abdel-HafezSynTest Technologies, Inc., Sunnyvale, California
About this Chapter
This chapter discusses design for testability (DFT) techniques for testing modern digital circuits. These DFT techniques are required in order to improve the quality and reduce the test cost of the digital circuit, while at the same time simplifying the test, debug and diagnose tasks. The purpose of this chapter is to provide readers with the knowledge to judge whether a design is implemented in a test-friendly manner and to recommend changes in order to improve the testability of the design for ...
Get VLSI Test Principles and Architectures now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.
