R12.0—Books
[bib12_001] [Athavale 2005] A. Athavale and C. Christensen, High-Speed Serial I/O Made Simple: A Designers’ Guide, with FPGA Applications, Xilinx Connectivity Solutions, San Jose, CA, 2005.
[bib12_002] [Cheng 2006] K.-T. Cheng, Embedded software-based self-testing for SoC design, in The Embedded Systems Handbook, R. Zurawski, Ed., CRC Press, Boca Raton, FL, 2006, chap. 28.
[bib12_003] [Dally 1998] W. J. Dally and J. W. Poulton, Digital Systems Engineering, Cambridge University Press, Cambridge, U.K., 1998.
[bib12_004] [Director 1994] S. W. Director and W. Maly, Eds., Advances in CAD for VLSI, Vol. 8, Statistical Approaches to VLSI Design, North Holland, Amsterdam, 1994.
[bib12_005] [Hsu 2002] T. R. Hsu, MEMS: Microsystems Design and Manufacture ...
Get VLSI Test Principles and Architectures now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.
