R11.0—Books
[bib11_001] [Burns 2001] M. Burns and G. W. Roberts, An Introduction to Mixed Signal IC Test and Measurement, Oxford University Press, London, 2001.
[bib11_002] [IEEE 1057-1994] IEEE Standard for Digitizing Waveform Recorders (IEEE 1057-1994), IEEE Press, New York, 1977.
[bib11_003] [IEEE 1149.1-1990] IEEE Standard Test Access Port and Boundary-Scan Architecture (IEEE 1149.1-1990), IEEE Press, New York, 1990.
[bib11_004] [IEEE 1149.4-1999] IEEE Standard for a Mixed-Signal Test Bus (IEEE 1149.4-1999), IEEE Press, New York, 1999.
[bib11_005] [IEEE 181-1977] IEEE Standard on Pulse Measurement and Analysis by Objective Techniques (IEEE 181-1977), IEEE Press, New York, 1994.
[bib11_006] [Mahoney 1987] M. Mahoney, DSP-Based Testing of Analog ...
Get VLSI Test Principles and Architectures now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.
