R7.0—Books
[bib07_001] [Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, Piscataway, NJ, 1994.
[bib07_002] [Bardell 1987] P. H. Bardell, W. H. McAnney, and J. Savir, Built-In Test for VLSI: Pseudorandom Techniques, John Wiley & Sons, Somerset, NJ, 1987.
[bib07_003] [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer Science, New York, 2000.
[bib07_004] [Jha 2002] N. K. Jha and S. K. Gupta, Testing of Digital Systems, Cambridge University Press, Cambridge, U.K., 2002.
[bib07_005] [Krstic 1998] A. Krstic and K.-T. Cheng, Delay Fault Testing for VLSI Circuits, Kluwer Academic, Boston, MA, ...
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