R5.0—Books
[bib5_001] [Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, Piscataway, NJ, 1994 (revised printing).
[bib5_002] [Bardell 1987] P. H. Bardell, W. H. McAnney, and J. Savir, Built-In Test for VLSI: Pseudorandom Techniques, John Wiley & Sons, Somerset, NJ, 1987.
[bib5_003] [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer Science, New York, 2000.
[bib5_004] [Golomb 1982] S. W. Golomb, Shift Register Sequence, Aegean Park Press, Laguna Hills, CA, 1982.
[bib5_005] [Jha 2003] N. K. Jha and S. K. Gupta, Testing of Digital Systems, Cambridge University Press, Cambridge, U.K., 2003. ...
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