Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Acronyms

ACE	Architectural Correct Execution
ALLS	Aligned Laboratory System
ALPEN	ALpha Particle source/drain PENtration
ALS	Absolute Laboratory System
ALU	Arithmetic-Logic Unit
AMUSE	Autonomous MUltilevel emulation system for Soft Error evaluation
ANITA	Atmospheric-like Neutrons from thIck TArget
AOI	Area Of Interest
ASIC	Application Specific Integrated Circuit
ASIL	Automotive Safety Integrity Level
ASTEP	Altitude Single event effects Test European Platform
AVF	Architectural Vulnerability Factor
AVP	Architectural Verification Program
BAN	Body Area Network
BCDMR	Bistable Cross-coupled Dual Modular Redundancy
BICS	Built-In Current Sensor
BISER	Built-In Soft Error Resilience
BIPS	Built-in Pulse Sensor
BIST	Built-In Self Test
BL	Bit Line
BNL	Brookhaven National Laboratory
BOX	Buried Oxide
BPSG	Boron Phosphor Silicate Glass
BUT	Board Under Test
CAM	Content Addressable Memory
CAN	Controller Area Network
CCD	Charge Coupled Device
CHB	CHecker Board
CHBc	CHecker Board complement
CL	Confidence Level
CLR	Cross-Layer Reliability
CM	Center of Mass
CMOS	Complementary Metal Oxide Semiconductor
CMP	Chemical Mechanical Polishing
CNL	UC Davis Crocker Nuclear Laboratory
CNRF	Cold Neutron Research Facility
CORIMS	COsmic Radiation IMpact Simulator
CPU	Central Processing Unit
CRAM	Configuration Random Access Memory
CRC	Cyclic Redundancy Code
CYCLON	Cyclotron of Louvain la Neuve
CYRIC	CYclotron and RadioIsotope Center
DCC	Duplication + Comparison + Checkpointing
DF	Derating Factor
DICE	Dual Interlocked storage CEll
DLL	Delay Locked Loop
DMR ...