Reliability and Failure of Electronic Materials and Devices, 2nd Edition

Acknowledgments

The idea for this book germinated in the classroom of Bell Laboratories, both at AT&T and Lucent Technologies, where I taught and organized several courses on reliability and failure of electronics over the past decade. Distilling the essence of the vast scattered information on this subject, first for course purposes and then into the text and figures that have emerged between these covers, would not have been possible without the resources of Bell Labs and the generous assistance of some very special people. Of these, two of my dear friends, Lucian (Lou) Kasprzak and Frank Nash, must be acknowledged first. Lou, an early observer of transistor hot-electron effects at IBM, is a member of the board of directors of the IEEE International ...