Higher Surge, Cable ESD, and Reliability
We will discuss surge and cable ESD events in Chap. 11 in more detail. Here we will just cover it rather briefly for completeness sake.
In surge and cable ESD testing, we apply the test pulses between PoE/MDI side and chassis ground. So, in effect, there is a high-voltage differential between PoE and host sides—just as in a hi-pot test. The dielectric withstand capability of the interface between domains (including PCB separations), must be assured at least to the level we are testing to. In fact, by bench testing we can confirm that the hi-pot test is less severe, volt to volt, than a surge test. For example, we will see that a unit that fails hi-pot prematurely at just 2 kV, will fail the surge test ...
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