Chapter 5. Power Integrity Analysis and EMI/EMC

Dipanjan Gope, Swagato Chakraborty, Vikram Jandhyala,Mosin Mondal, Woopoung Kim, Souvik Mukherjee,Rajen Murugan, and Raj Nair

5.1 Introduction

The advancement of semiconductor technology has enabled integrated circuits to operate at higher speeds with lower power; 22 nm node transistors are faster than 45 nm node transistors despite lower supply voltages. However, digital circuits at higher speeds and lower voltages generally have smaller noise margins and are more sensitive to noise. The accurate simulation of noise and its impact on digital circuits is therefore critical in designing high-speed integrated circuits. Signal integrity (SI) and power integrity (PI) deal with noise and its impact ...

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