Acknowledgments
The author thanks the International Electrotechnical Commission (IEC) for permission to reproduce information from its International Standards IEC 61508-1 ed.2.0 (2010), IEC 61508-3 ed.2.0 (2010), and IEC 61511-1 ed.1.0 (2003). All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available from www.iec.ch. IEC has no responsibility for the placement and context in which ...
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