Current and future titles in the Royal Microscopical Society— John Wiley Series
Published
Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM)
Debbie Stokes
Aberration-Corrected Analytical Electron Microscopy
Edited by Rik Brydson
Diagnostic Electron Microscopy— A Practical Guide to Interpretation and Technique
Edited by John W. Stirling, Alan Curry & Brian Eyden
Low Voltage Electron Microscopy— Principles and Applications
Edited by David C. Bell & Natasha Erdman
Forthcoming
Atlas of Images and Spectra for Electron Microscopists
Edited by Ursel Bangert
Understanding Practical Light Microscopy
Jeremy Sanderson
Focused Ion Beam Instrumentation: Techniques and Applications
Dudley Finch & Alexander Buxbaum
Electron Beam-Specimen Interactions and Applications in Microscopy
Budhika Mendis
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