Book description
Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.
It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.
Table of contents
- Cover
- Current and future titles in the Royal Microscopical Society- John Wiley Series
- Title Page
- Copyright
- List of Contributors
- Preface
-
Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy
- 1.1 Introduction
- 1.2 Historical Perspective
- 1.3 Beam Interaction with Specimen—Elastic and Inelastic Scattering
- 1.4 Instrument Configuration
- 1.5 Influence of Electron Optics Aberrations at Low Voltages
- 1.6 SEM Imaging at Low Voltages
- 1.7 TEM/STEM Imaging and Analysis at Low Voltages
- 1.8 Conclusion
- References
- Chapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis
- Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator
- Chapter 4: The Application of Low-Voltage SEM—From Nanotechnology to Biological Research
- Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy
- Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits
- Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces
- Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy
- Index
Product information
- Title: Low Voltage Electron Microscopy: Principles and Applications
- Author(s):
- Release date: February 2013
- Publisher(s): Wiley
- ISBN: 9781119971115
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