Information Assurance

5.3. Design for Survivability

When addressing certain aspects of a problem that become too difficult to handle in an add-on fashion, an integrated approach is advised. Design for testability is a perfect example. By the 1980s, integrated circuits had become so large that exhaustive testing became infeasible. To test a circuit, an input vector (or sequence of vectors) is applied that will produce different outputs in the presence and absence of a fault [16]. The problem is termed the test vector problem, and the determination of vectors that reveal faults are known as the test vector generation problem. There are algorithms for testing combinational circuits [17], however, the problem of generating test vectors for given faults has been shown ...