Handbook of Flexible Organic Electronics

9

In situ characterization of organic electronic materials using X-ray techniques

S. Grigorian     University of Siegen, Siegen, Germany

Abstract

In situ X-ray studies have gained an increased attention in the recent years. In particular, it is crucial for organic electronics where minor variations in the fabrication protocol cause dramatic changes in devices performance. Therefore, real-time monitoring can be an indispensable tool for the control and enhancement of the final device. The advantage of time-resolved grazing incidence X-ray diffraction is demonstrated for conjugated thiophene-based organic systems. In situ studies allow reconstructing the whole history of organic film fabrication where at each stage of solidification the structural ...