Fig. 1-1. Earth regimes of concern for on-orbit surface charging hazards for spacecraft passing through the latitude and altitude indicated. See Whittlesey et al.  for an alternative reference with the ``Wishbone'' chart. (From .)
Fig. 1-2. Earth regimes of concern for on-orbit internal charging hazards for spacecraft with circular orbits.
Fig. 3-2. Examples of solar array failures caused by (a) in-flight arcing (from ) and (b) ground ESD arcing.
Fig. 3-3. Measured gallium arsenide (GaAs) coupon I/V failure threshold (From .)
Fig. 3-4. Measured silicon (Si) coupon I/V failure threshold (From .)
Fig. 6-1. Safe, intermediate, and possibly hazardous dielectric materials based on resistivity and dielectric constant and resulting time constant. (The Kapton© and Teflon© boxes illustrate the uncertainty range for space applications; see the text.)