Index
A
AES
aging
anisotropy
B
bias
Bragg
Bragg Brentano
breakdown
C
calibrage
calibration
cathodic sputtering
coercive field
composites
conduction mode
constraints
crystallization
Curie
constant
temperature
D
designs of experiments
dielectric
constant
losses
measure
diffraction
E
EDS
electromagnetic waves
electron microscopy
embedding
extrapolation
F
failure mechanism
fatigue
ferroelectric
fiability
films transfer
first order
G
grazing incidence
H
high-frequency
hybrid capacitor
hyper-frequency
hysteresis
I
integrated capacitors
integrating
integration
interfaces
ion beam sputtering
L
lattice parameter
leakage
current
current behavior
life
lifetime
linearity
M
MIM
MOCVD
Molecular beam epitaxy
motion
N
non-volatile memories
O
orientation
oxygen vacancies
P
paraelectric
percolation
permittivity
perovskite
phase
phase transition
polarization
pole figure
powder diffraction
propagation exponent
pulsed laser ablation
PZT
Q
quadripoles
R
radio-frequency
RBS
real leakage current
relaxation currents
reliability
remanent polarization
resistance degradation
rocking curve
S
scattering waves
Schottky
second-order
signal flow graph
SIMS
Sol-gel
space charge
spectroscopy analysis
sputtering
STO
strain
stresses
substrate
T
texturing
thermodynamic
thin
film
layer
transition
transmission line
tunabilities
V
variable capacitor
W
wavelength
Weibull
X
X-ray
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