Chapter 14. Fault simulation and test generation
About This Chapter
Very large-scale integration (VLSI) circuits can be defective because of the imperfect manufacturing process. One of the most important tasks in VLSI testing is to minimize the number of defective chips shipped to customers. The quality of test patterns is critical in determining the thoroughness of testing. This requires the assessment of the quality of test patterns either developed manually or generated automatically so that a desired product quality can be achieved.
This chapter consists of two major VLSI testing topics: fault simulation and test generation. In fault simulation, we start with a discussion on fault collapsing. After an introduction of equivalent faults and ...
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