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Electromigration in Thin Films and Electronic Devices by C-U Kim

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2

Modeling electromigration using the peridynamics approach

D.T. Read and V.K. Tewary,     National Institute of Standards and Technology (NIST) USA

W.H. Gerstle,     University of New Mexico USA

Abstract:

This chapter presents a summary of the information and reasoning needed to justify learning about peridynamics for the purpose of analyzing electromigration and provides guidance for the development of a complete peridynamics analysis. The additions needed to convert the original peridynamics model as developed for mechanics problems to a multiphysics model capable of treating electromigration are reviewed. Experimental data on void drift by electromigration are introduced to provide a specific target for a demonstration of the peridynamical ...

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