Appendix B. Acronyms
ALM
Application Lifecycle Management
BIST
Built-In Self Test (a common synonym for BIT)
BIT
Built-in Test
CCB
Change Control Board
CM
Configuration Management
COM
Communication
COQUALMO
Constructive QUALity Model
COTS
Commercial off-the-Shelf
CUT
Component under Test
ETA
Event Tree Analysis
FMECA
Failure Modes and Effects Criticality Analysis
FP
Function Point
FRP
Full Rate of Production
FTA
Fault Tree Analysis
GEN
General
GIG
Global Information Grid
GOTS
Government off-the-Shelf
HFE
Human Factors Engineering
IBIT
Interrupt-driven Built-in Test
INT
Integration test
IPT
Integrated Product Team
IRAD
Independent Research and Development
ISTQB
International Software Testing Qualification Board
LRIP
Low Rate of Initial Production ...
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