Abbreviations
14:24 | (Sr,Ca)14Cu24O41 |
BAW | Bulk Acoustic Waves |
Bi2223 | (Bi,Pb)2Sr2Ca2Cu3O10+x |
Bi2212 | (Bi,Pb)2Sr2Ca1Cu2O8+x |
CAPS | Curved-Area Position Sensitive detector |
CCL | Comarginal Crossed Lamellar layer |
CPS | Curved Position Sensitive detector |
CSL | Coincidence Site Lattices |
EBSD | Electron Back-Scattering Diffraction |
EDX | Energy Dispersive X-ray |
ESR | Electron Spin Resonance |
FAp | Ca10(PO4)6F2 |
FWHM | Full Width at Half Maximum |
HAp | Ca10(PO4)6(OH)2 |
HRTEM | High-Resolution TEM |
HWHM | Half Width at Half Maximum |
HWHD | Half Width at Half maximum of the distribution Density |
ILL | Institut Laue-Langevin |
LN | LiNbO3 |
MPB | Morphotropic Phase Boundary |
MQTA | Magnetic Quantitative Texture Analysis |
m.r.d. | Multiple of a Random Distribution |
MTG | Melt Texture Growth |
NMR | Nuclear Magnetic Resonance |
ODF | Orientation Distribution Function |
PSD | Position Sensitive Detector |
PZT | Pb(Zr,Ti)O3 |
PL | PhotoLuminescence |
PLE | PhotoLuminescence Excitation |
QMA | Quantitative Microstructure Analysis |
QPA | Quantitative Phase Analysis |
QTA | Quantitative Texture Analysis |
RCL | Radial Crossed Lamellar layer |
RSA | Residual Strain-stress Analysis |
RTGG | Reactive Templated Grain-Growth |
SBN | SrBi2Nb2O9 |
SEM | Scanning Electron Microscope |
TEM | Transmission Electron Microscope |
TGG | Templating Grain Growth |
TSMTG | Top-Seeded Melt Texture Growth |
XRR | X-Ray specular Reflectivity |
Y123 | YBa2Cu3O7-δ |
Y211 | Y2BaCuO5 |
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