Table of Contents
Chapter 1: Some Basic Notions About Powder Diffraction
1.1. Crystallite, grain, polycrystal and powder
1.2. Bragg’s law and harmonic reflections
1.3. Geometric conditions of diffraction, Ewald sphere
1.5. Main diffraction line profile components
1.7. Modeling of the diffraction peaks
1.9. Intensity calibration (flat-field)
1.11. Probed thickness (penetration depth)
Chapter 2: Structure Refinement by Diffraction Profile Adjustment (Rietveld Method)
2.1. Principle of the Rietveld method
2.4. Crystal structure databases
2.5. Reliability factors in profile refinements
2.10. Structural determination by diffraction
Chapter 3: Automatic Indexing of Powder Diagrams
Chapter 4: Quantitative Texture Analysis
4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.3. Distribution density and normalization
4.4. Direct and normalized pole figures
4.6. Fundamental equation of quantitative texture analysis
4.7. Resolution of the fundamental equation
4.8. OD refinement reliability estimators
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