ACKNOWLEDGMENTS

Our special thanks to (1) the following individuals at John Wiley & Sons: Beth Lang Golub, Executive Editor; Susan Elbe, Publisher; Ann Berlin, Vice President of Production and Manufacturing; Lorraina Raccuia, Assistant Editor; (2) Shelley Flannery, Copy Editor and Proofreader; (3) Ed Burke and Lorraine Burke of Studio 25N for project management; and (4) Carol L. Eisen for her invaluable assistance in the preparation of the manuscript.

We thank the following reviewers and survey respondents for their many helpful suggestions: Anthony Basilico, Community College of Rhode Island; Alfred Benoit, Johnson & Wales University; Joel Bernstein, DePaul University; Raymond Daniel, University of Central Oklahoma; Ann Fruhling, University of Nebraska–Omaha; Malcolm J. W. Gibson, Devry University; Trudy M. Gift, Hagerstown Community College; John Grznar, University of Texas–Arlington; Cynthia Jenson, Jacksonville State University; Denise S. Leete, Pennsylvania College of Technology; Robert Lieb, Texas Tech University; Ronald Lemos, California State, LA; Michael James Payne, Purdue University; Cynthia Riemenschneider, University of Arkansas; Loren K. Rhodes, Juniata College; Carl Slemmer, Frostburg State University; Peter H. W. van der Goes, Rose State College; Vernon A. Vollertsen, University of Central Oklahoma; Ken Weiss, Baldwin Wallace; Charles R. Woratschek, Robert Morris University; Ronald Zucker, University of North Florida.

A special word of thanks to Hofstra University ...

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