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Characterization of Organic Thin Films

Book Description

Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering.

This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such.

Readers will find detailed information on:

  • Various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy

  • X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy

  • Concise Summaries of major characterization technologies for organic thin films, including, Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM

Table of Contents

  1. Cover Page
  2. Materials Characterization Series
  3. Title Page
  4. Copyright
  5. Contents
  6. Preface to the Reissue of the Materials Characterization Series
  7. Preface to Series
  8. Preface to the Reissue of Characterization of Organic Thin Films
  9. Preface
  10. Contributors
  11. Part I
    1. 1 Langmuir-Blodgett Films
    2. 2 Self-Assembled Monolayers
  12. Part II
    1. 3 Spectroscopic Ellipsometry
    2. 4 Infrared Spectroscopy in the Characterization of Organic Thin Films
    3. 5 Raman Spectroscopic Characterization of Organic Thin Films
    4. 6 Surface Potential
    5. 7 X-Ray Diffraction
    6. 8 High Resolution EELS Studies of Organic Thin Films and Surface
    7. 9 Wetting
    8. 10 Secondary Ion Mass Spectrometry As Applied to Thin Organic and Polymeric Films
    9. 11 X-Ray Photoelectron Spectroscopy of Organic Thin Films
    10. 12 Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation
  13. Appendix: Technique Summaries
    1. Auger Electron Spectroscopy (AES)
    2. Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)
    3. Fourier Transform Infrared Spectroscopy (FTIR)
    4. High-Resolution Electron Energy Loss Spectroscopy (HREELS)
    5. Low-Energy Electron Diffraction (LEED)
    6. Raman Spectroscopy
    7. Scanning Electron Microscopy (SEM)
    8. Scanning Tunneling Microscopy (STM) and Scanning Force Microscopy (SFM)
    9. Static Secondary Ion Mass Spectrometry (Static SIMS)
    10. Transmission Electron Microscopy (TEM)
    11. Variable-Angle Spectroscopic Ellipsometry (VASE)
    12. Variable-Angle Spectroscopic Ellipsometry (VASE)
    13. Variable-Angle Spectroscopic Ellipsometry (VASE)
    14. X-Ray Photoelectron Spectroscopy (XPS)
  14. Index