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Characterization of Composite Materials by Hatsuo Ishida

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7

Imaging and Characterization of Materials by the New Scanning Probe Techniques (STM/AFM)

P.C.M GRIM and G. HADZIIOANNOU

Contents

7.1 Introduction to Scanning Probe Microscopy (SPM)

7.2 Scanning Tunneling Microscopy

7.3 Atomic Force Microscopy

7.4 Surface Modifications with STM/AFM

7.5 Related Scanning Techniques

7.6 Applications to Polymer Composite Materials

7.7 The Future of SPM

7.1 Introduction to Scanning Probe Microscopy (SPM)

The introduction of the scanning tunneling microscope (STM) in 1982 by Binnig and Rohrer changed the field of surface science.1 This new tool allows individual atoms on the surface of a solid to be recognized directly in real space.

The STM, like all other scanning probe microscopes, relies on the scanning of a ...

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