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References

Aboulhamid, M. E., and E. Cemy (1983), “A Class of Test Generators for Built-in Testing,” IEEE Trans. Comput., C-32(10), 957–959.

Abraham, J. A. (1981), “Functional Level Test Generation for Complex Digital Systems,” 1981 International Test Conference, Philadelphia, PA, October, pp. 461–462.

Agarwal, V. K. (1983), “Increasing Effectiveness of Built-in Testing by Output Data Modification,” 13th Annual Fault-Tolerant Computing Symposium, Milan, Italy, June, pp. 227–233.

Agarwal, V. K., and E. Cemy (1981), “Store and Generate Built-In-Testing Approach,” 11th Annual Fault-Tolerant Computing Symposium, Portland, ME, June, pp. 35–40.

Agrawal, V. D., and M. R. Mercer (1982), “Testability Measures—What Do They Tell Us?,” 1982 International Test Conference, Philadelphia, PA, November, pp. 391–396.

Ando, H. (1980), “Testing VLSI with Random Access Scan,” Digest of Papers, COMPCON 80, February, pp. 50–52.

Arzoumanian, Y., and J. Waicukauski (1981), “Fault Diagnosis in an LSSD Environment,” 1981 International Test Conference, Philadelphia, PA, October, pp. 86–88.

Bardell, P. H., and W. H. McAnney (1981), “A View from the Trenches: Production Testing of a Family of VLSI Multichip Modules,” 11th Annual Fault-Tolerant Computing Symposium, Portland, ME, June, pp. 281–283.

Bardell, P. H., and W. H. McAnney (1982), “Self-Testing of Multichip Logic Modules,” 1982 International Test Conference, ...

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