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Copyright © 1987 by John Wiley & Sons, Inc.
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Library of Congress Cataloging in Publication Data:
Bardell, Paul H.
Built-in test for VLSI.
“A Wiley-Interscience publication.”
Bibliography: p.
Includes index.
1. Integrated circuits-Very large scale integration Testing. I. McAnney. William H. II. Savir, Jacob. III. Title.
TK.7874.B374 1987 621.381'73 87-23013
ISBN: 0-471-62463-2
10 9 8 7 6 5 4 3
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