Index
- 2-wire measurement
- 3-wire measurement
- 4-wire measurement
A
- ADC
- differential linearity error
- double ramp
- flash
- gain error
- half-flash
- integral linearity error
- noise floor
- noise free bits
- noise shaping
- offset
- pipeline
- sigma-delta
- single ramp
- successive approximation
- successive approximation, (SAR)
- aliasing
- anti-aliasing filter
- analog to digital converter
- analog switch
B, C
- bandgap reference
- clipping
- clock
- falling edge
- rising edge
- CMOS
- cold junction
- compensation
- comparator
- counter
D, E
- DAC
- R2R ladder
- dark current
- decimation
- differential voltage
- digital
- bus
- storage
- electromagnetic compatibility
- EMC coupling
- capacitive
- common impedance
- inductive
- radiative
F, G
- feedback
- filters
- active
- all-pole
- band-pass
- Bessel-Thompson
- Butterworth
- Cauer
- Chebyshev
- elliptic
- frequency transforms
- high-pass
- low-pass
- notch
- passive
- FPGA
- gauge factor
- general impedance converters
- Gray code
- gyrators
H, I, J
- hot junction
- I2C
- instrumentation amplifier
- jitter
K, L, M
- Kelvin
- contact
- double bridge
- latch
- lead wire resistance
- linear variable differential transformer
- measurand
- microcontroller
- multiplexer
N
- negative frequency
- noise
- 1/f
- avalanche
- breakdown
- filtering
- flicker
- Poisson
- popcorn
- RTS
- shot
- signal to noise ratio (SNR)
- thermal
- nonlinearity
- Nyquist-Shannon theorem
O
- operational amplifier
- auto-zero op-amp
- chopper stabilized op-amp
- current feedback
- ideal model
- offset voltage
- precision op-amp
- rail to rail
- saturation
- voltage feedback
- operational amplifiers ...
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